Stop chasing models: Why data-first architecture matters now more than ever

NetApp CEO George Kurian explains how a data-first architecture is the key to delivering AI outcomes that are both scalable ...
IEEE

Efficient Modulated State Space Model for Mixed-Type Wafer Defect Pattern Recognition

Abstract: Accurate and efficient wafer defect detection is crucial in semiconductor manufacturing to maintain product quality and optimize yield. Traditional methods struggle with the complexity and ...